| 2005 |
|---|
| 3 | EE | R. Rölver,
O. Winkler,
M. Först,
B. Spangenberg,
H. Kurz:
Light emission from Si/SiO2 superlattices fabricated by RPECVD.
Microelectronics Reliability 45(5-6): 915-918 (2005) |
| 2 | EE | M. C. Lemme,
J. K. Efavi,
H. D. B. Gottlob,
T. Mollenhauer,
T. Wahlbrink,
H. Kurz:
Comparison of metal gate electrodes on MOCVD HfO2.
Microelectronics Reliability 45(5-6): 953-956 (2005) |
| 1998 |
|---|
| 1 | EE | J. Fischer,
C. Müller,
H. Kurz:
A Co-simulation Concept for an Efficient Analysis of Complex Logic Designs.
FPL 1998: 495-499 |
