| |
| 2007 | ||
|---|---|---|
| 2 | EE | Hideaki Kurata, Satoshi Noda, Yoshitaka Sasago, Kazuo Otsuga, Tsuyoshi Arigane, Tetsufumi Kawamura, Takashi Kobayashi, Hitoshi Kume, Kazuki Homma, Teruhiko Ito, Yoshinori Sakamoto, Masahiro Shimizu, Yoshinori Ikeda, Osamu Tsuchiya, Kazunori Furusawa: A 126 mm2 4-Gb Multilevel AG-AND Flash Memory with Inversion-Layer-Bit-Line Technology. IEICE Transactions 90-C(11): 2146-2156 (2007) |
| 1991 | ||
| 1 | EE | Takeshi Nakajo, Hitoshi Kume: A Case History Analysis of Software Error Cause-Effect Relationships. IEEE Trans. Software Eng. 17(8): 830-838 (1991) |
| 1 | Tsuyoshi Arigane | [2] |
| 2 | Kazunori Furusawa | [2] |
| 3 | Kazuki Homma | [2] |
| 4 | Yoshinori Ikeda | [2] |
| 5 | Teruhiko Ito | [2] |
| 6 | Tetsufumi Kawamura | [2] |
| 7 | Takashi Kobayashi | [2] |
| 8 | Hideaki Kurata | [2] |
| 9 | Takeshi Nakajo | [1] |
| 10 | Satoshi Noda | [2] |
| 11 | Kazuo Otsuga | [2] |
| 12 | Yoshinori Sakamoto | [2] |
| 13 | Yoshitaka Sasago | [2] |
| 14 | Masahiro Shimizu | [2] |
| 15 | Osamu Tsuchiya | [2] |