| 2004 |
| 12 | | Alessandro Savio,
Luigi Colalongo,
Zsolt Miklós Kovács-Vajna,
Michele Quarantelli:
Scaling rules and parameter tuning procedure for analog design reuse in technology migration.
ISCAS (5) 2004: 117-120 |
| 2003 |
| 11 | EE | Alessandro Savio,
Anna Richelli,
Luigi Colalongo,
Zsolt Miklós Kovács-Vajna:
A fully-integrated self-tuned transformer based step-up converter.
ISCAS (1) 2003: 357-360 |
| 10 | EE | A. Pretelli,
Anna Richelli,
Luigi Colalongo,
Zsolt Miklós Kovács-Vajna:
Increasing the immunity to electromagnetic interferences in a bandgap voltage reference.
ISCAS (1) 2003: 377-380 |
| 9 | EE | Anna Richelli,
Luigi Colalongo,
Zsolt Miklós Kovács-Vajna:
Increasing the immunity to electromagnetic interferences of CMOS OpAmps.
IEEE Transactions on Reliability 52(3): 349-353 (2003) |
| 2000 |
| 8 | EE | Zsolt Miklós Kovács-Vajna:
A Fingerprint Verification System Based on Triangular Matching and Dynamic Time Warping.
IEEE Trans. Pattern Anal. Mach. Intell. 22(11): 1266-1276 (2000) |
| 7 | EE | Zsolt Miklós Kovács-Vajna,
Riccardo Rovatti,
Mirko Frazzoni:
Fingerprint ridge distance computation methodologies.
Pattern Recognition 33(1): 69-80 (2000) |
| 1997 |
| 6 | EE | Arrigo Benedetti,
Zsolt Miklós Kovács-Vajna:
Confidence computation improvement in an optical field reading system.
ICDAR 1997: 836-841 |
| 1995 |
| 5 | EE | K. Kuhnke,
L. Simoncini,
Zsolt Miklós Kovács-Vajna:
A system for machine-written and hand-written character distinction.
ICDAR 1995: 811- |
| 4 | EE | L. Simoncini,
Zsolt Miklós Kovács-Vajna:
A system for reading USA census '90 hand-written fields.
ICDAR 1995: 86-91 |
| 3 | EE | Zsolt Miklós Kovács-Vajna:
A novel architecture for high quality hand-printed character recognition.
Pattern Recognition 28(11): 1685-1692 (1995) |
| 2 | EE | Zsolt Miklós Kovács-Vajna,
Roberto Guerrieri:
Massively-parallel handwritten character recognition based on the distance transform.
Pattern Recognition 28(3): 293-301 (1995) |
| 1991 |
| 1 | EE | Zsolt Miklós Kovács-Vajna,
Massimo Rudan:
Boundary fitted coordinated generation for device analysis on composite and complicated geometries.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(10): 1242-1250 (1991) |