J. J. Kopanski

2005
1	EE	J. Yang, J. J. Kopanski, A. Postula, M. Bialkowski: Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy. Microelectronics Reliability 45(5-6): 887-890 (2005)

Coauthor Index

1	M. Bialkowski	[1]
2	A. Postula	[1]
3	J. Yang	[1]