| |
| 2005 | ||
|---|---|---|
| 1 | EE | J. Yang, J. J. Kopanski, A. Postula, M. Bialkowski: Experimental investigation of the dielectric-semiconductor interface with scanning capacitance microscopy. Microelectronics Reliability 45(5-6): 887-890 (2005) |
| 1 | J. J. Kopanski | [1] |
| 2 | A. Postula | [1] |
| 3 | J. Yang | [1] |