Johann Otto
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1991
1
EE
Jochen Kolzer
, Johann Otto: Electrical Characterization of Megabit DRAMs, Part 2: Internal Testing.
IEEE Design & Test of Computers 8
(4): 39-51 (1991)
Coauthor
Index
1
Jochen Kolzer
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
