| |
| 2008 | ||
|---|---|---|
| 1 | EE | Hafizur Rahaman, Dipak K. Kole, Debesh Kumar Das, Bhargab B. Bhattacharya: On the Detection of Missing-Gate Faults in Reversible Circuits by a Universal Test Set. VLSI Design 2008: 163-168 |
| 1 | Bhargab B. Bhattacharya | [1] |
| 2 | Debesh Kumar Das (Debesh K. Das) | [1] |
| 3 | Hafizur Rahaman | [1] |