Matthew P. Koehler

2001
1	EE	Kendall D. Hester, Matthew P. Koehler, Hanna Kanciak-Chwialkowski, Brian H. Jones: An assessment of the value of added screening of electronic components for commercial aerospace applications. Microelectronics Reliability 41(11): 1823-1828 (2001)

Coauthor Index

1	Kendall D. Hester	[1]
2	Brian H. Jones	[1]
3	Hanna Kanciak-Chwialkowski	[1]