| |
| 2001 | ||
|---|---|---|
| 1 | EE | Kendall D. Hester, Matthew P. Koehler, Hanna Kanciak-Chwialkowski, Brian H. Jones: An assessment of the value of added screening of electronic components for commercial aerospace applications. Microelectronics Reliability 41(11): 1823-1828 (2001) |
| 1 | Brian H. Jones | [1] |
| 2 | Hanna Kanciak-Chwialkowski | [1] |
| 3 | Matthew P. Koehler | [1] |