K. Kern

2006
2	EE	A. Rastelli, Mathieu Stoffel, G. Katsaros, J. Tersoff, U. Denker, T. Merdzhanova, G. S. Kar, G. Costantini, K. Kern, H. von Känel: Reading the footprints of strained islands. Microelectronics Journal 37(12): 1471-1476 (2006)
2002
1	EE	O. Jeandupeux, V. Marsico, A. Acovic, P. Fazan, H. Brune, K. Kern: Use of scanning capacitance microscopy for controlling wafer processing. Microelectronics Reliability 42(2): 225-231 (2002)

Coauthor Index

1	A. Acovic	[1]
2	H. Brune	[1]
3	G. Costantini	[2]
4	U. Denker	[2]
5	P. Fazan	[1]
6	O. Jeandupeux	[1]
7	H. von Känel	[2]
8	G. S. Kar	[2]
9	G. Katsaros	[2]
10	V. Marsico	[1]
11	T. Merdzhanova	[2]
12	A. Rastelli	[2]
13	Mathieu Stoffel	[2]
14	J. Tersoff	[2]

Colors in the list of coauthors