Todd P. Kelsey
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1993
1
Todd P. Kelsey,
Kewal K. Saluja
,
Soo Young Lee
: An Efficient Algorithm for Sequential Circuit Test Generation.
IEEE Trans. Computers 42
(11): 1361-1371 (1993)
Coauthor
Index
1
Soo Young Lee
[
1
]
2
Kewal K. Saluja
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
