M. A. Kelly

2001
1	EE	L. G. Henry, M. A. Kelly, T. Diep, J. Barth: Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectronics Reliability 41(3): 407-415 (2001)

Coauthor Index

1	J. Barth	[1]
2	T. Diep	[1]
3	L. G. Henry	[1]