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| 2001 | ||
|---|---|---|
| 1 | EE | L. G. Henry, M. A. Kelly, T. Diep, J. Barth: Issues concerning charged device model ESD verification modules - the need to move to alumina. Microelectronics Reliability 41(3): 407-415 (2001) |
| 1 | J. Barth | [1] |
| 2 | L. G. Henry | [1] |
| 3 | M. A. Kelly | [1] |