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Madhavi Karkala

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1998
1EEMadhavi Karkala, Nur A. Touba, Hans-Joachim Wunderlich: Special ATPG to Correlate Test Patterns for Low-Overhead Mixed-Mode BIST. Asian Test Symposium 1998: 492-499

Coauthor Index

1Nur A. Touba [1]
2Hans-Joachim Wunderlich [1]

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