| |
| 2004 | ||
|---|---|---|
| 1 | EE | Hyuck In Kwon, In Man Kang, Byung-Gook Park, Jong Duk Lee, Sang Sik Park, Jung Chak Ahn, Yong Hee Lee: Effects of electrical stress on mid-gap interface trap density and capture cross sections in n-MOSFETs characterized by pulsed interface probing measurements. Microelectronics Reliability 44(1): 47-51 (2004) |
| 1 | Jung Chak Ahn | [1] |
| 2 | Hyuck In Kwon | [1] |
| 3 | Jong Duk Lee | [1] |
| 4 | Yong Hee Lee | [1] |
| 5 | Byung-Gook Park | [1] |
| 6 | Sang Sik Park | [1] |