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M. Jurisch

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2006
1EEW. Dreyer, F. Duderstadt, S. Eichler, M. Jurisch: Stress analysis and bending tests for GaAs wafers. Microelectronics Reliability 46(5-6): 822-835 (2006)

Coauthor Index

1W. Dreyer [1]
2F. Duderstadt [1]
3S. Eichler [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)