| |
| 2005 | ||
|---|---|---|
| 2 | EE | Francesco Iannuzzo: Non-destructive Testing Technique for MOSFET's Characterisation during Soft-Switching ZVS Operations. Microelectronics Reliability 45(9-11): 1738-1741 (2005) |
| 2003 | ||
| 1 | EE | Giovanni Busatto, Roberto La Capruccia, Francesco Iannuzzo, Francesco Velardi, Roberto Roncella: MAGFET based current sensing for power integrated circuit. Microelectronics Reliability 43(4): 577-583 (2003) |
| 1 | Giovanni Busatto | [1] |
| 2 | Roberto La Capruccia | [1] |
| 3 | Roberto Roncella | [1] |
| 4 | Francesco Velardi | [1] |