| |
| 1994 | ||
|---|---|---|
| 2 | Chauchin Su, Kychin Hwang, Shyh-Jye Jou: An IDDQ Based Built-in Concurrent Test Technique for Interconnects in a Boundary-Scan Environment. ITC 1994: 670-676 | |
| 1993 | ||
| 1 | Chauchin Su, Kychin Hwang: A Serial-Scan Test-Vector-Compression Methodology. ITC 1993: 981-988 | |
| 1 | Shyh-Jye Jou | [2] |
| 2 | Chauchin Su | [1] [2] |