William R. Hunter
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2005
1
EE
N. S. Nagaraj
, William R. Hunter,
Poras T. Balsara
,
Cyrus D. Cantrell
: The Impact of Inductance on Transients Affecting Gate Oxide Reliability.
VLSI Design 2005
: 709-713
Coauthor
Index
1
Poras T. Balsara
[
1
]
2
Cyrus D. Cantrell
[
1
]
3
N. S. Nagaraj
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
