Douglas B. Hunt

List of publications from the DBLP Bibliography Server - FAQ

2003

2 EE Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectronics Reliability 43(1): 17-41 (2003)

2002

1 EE Guenther Benstetter, Michael W. Ruprecht, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. Microelectronics Reliability 42(3): 307-316 (2002)

2003
2	EE	Michael W. Ruprecht, Guenther Benstetter, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs. Part II: Defect isolation and visualization. Microelectronics Reliability 43(1): 17-41 (2003)
2002
1	EE	Guenther Benstetter, Michael W. Ruprecht, Douglas B. Hunt: A review of ULSI failure analysis techniques for DRAMs 1. Defect localization and verification. Microelectronics Reliability 42(3): 307-316 (2002)

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