Guang Yu Huang
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2006
1
EE
Guang Yu Huang,
Cher Ming Tan
: Device level electrical-thermal-stress coupled-field modeling.
Microelectronics Reliability 46
(9-11): 1823-1827 (2006)
Coauthor
Index
1
Cher Ming Tan
[
1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
