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Yuan-Chieh Hsu

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2001
4EEPankaj Pant, Yuan-Chieh Hsu, Sandeep K. Gupta, Abhijit Chatterjee: Path delay fault diagnosis in combinational circuits with implicitfault enumeration. IEEE Trans. on CAD of Integrated Circuits and Systems 20(10): 1226-1235 (2001)
1998
3EEYuan-Chieh Hsu, Sandeep K. Gupta: An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing. Asian Test Symposium 1998: 88-95
2EEYuan-Chieh Hsu, Sandeep K. Gupta: A new path-oriented effect-cause methodology to diagnose delay failures. ITC 1998: 758-
1996
1 Yuan-Chieh Hsu, Sandeep K. Gupta: A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational Circuits. IEEE Trans. Computers 45(11): 1312-1318 (1996)

Coauthor Index

1Abhijit Chatterjee [4]
2Sandeep K. Gupta [1] [2] [3] [4]
3Pankaj Pant [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)