2001 | ||
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4 | EE | Pankaj Pant, Yuan-Chieh Hsu, Sandeep K. Gupta, Abhijit Chatterjee: Path delay fault diagnosis in combinational circuits with implicitfault enumeration. IEEE Trans. on CAD of Integrated Circuits and Systems 20(10): 1226-1235 (2001) |
1998 | ||
3 | EE | Yuan-Chieh Hsu, Sandeep K. Gupta: An Automatic Test Pattern Generator for At-Speed Robust Path Delay Testing. Asian Test Symposium 1998: 88-95 |
2 | EE | Yuan-Chieh Hsu, Sandeep K. Gupta: A new path-oriented effect-cause methodology to diagnose delay failures. ITC 1998: 758- |
1996 | ||
1 | Yuan-Chieh Hsu, Sandeep K. Gupta: A Simulator for At-Speed Robust Testing of Path Delay Faults in Combinational Circuits. IEEE Trans. Computers 45(11): 1312-1318 (1996) |
1 | Abhijit Chatterjee | [4] |
2 | Sandeep K. Gupta | [1] [2] [3] [4] |
3 | Pankaj Pant | [4] |