Pei-Ying Hsieh

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2006

1 EE Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou: Exploring linear structures of critical path delay faults to reduce test efforts. ICCAD 2006: 100-106

2006
1	EE	Shun-Yen Lu, Pei-Ying Hsieh, Jing-Jia Liou: Exploring linear structures of critical path delay faults to reduce test efforts. ICCAD 2006: 100-106

Coauthor Index

1 Jing-Jia Liou [1]

2 Shun-Yen Lu [1]