| |
| 1998 | ||
|---|---|---|
| 3 | EE | Luke S. L. Hsieh: Reduction of errors due to source and meter in the nonlinearity test. ITC 1998: 254-257 |
| 1995 | ||
| 2 | Luke S. L. Hsieh, Andrew Grochowski: THD and SNR Tests Using the Simplified Volterra Series with Adaptive Algorithms. ITC 1995: 364-369 | |
| 1994 | ||
| 1 | Luke S. L. Hsieh, Sandeep P. Kumar: Digitizer Error Extraction in the Nonlinearity Test. ITC 1994: 757-762 | |
| 1 | Andrew Grochowski | [2] |
| 2 | Sandeep P. Kumar | [1] |