| 2001 |
|---|
| 3 | | Toshifumi Honda,
Shree K. Nayar:
Finding ``Anomalies'' in an Arbitrary Image.
ICCV 2001: 516-523 |
| 1996 |
|---|
| 2 | EE | Toshifumi Honda,
Yukio Matsuyama,
Hisae Yamamura,
Hideaki Sasazawa,
Takanori Ninomiya,
Ludwig Listl,
Anton Schick,
Richard Schneider:
Automated Visual Inspection Algorithm for Solder Joint of Surface Mount Devices Based on Three Dimensional Shape Analysis.
MVA 1996: 261-266 |
| 1994 |
|---|
| 1 | EE | Toshifumi Honda,
Hisae Yamamura,
Syouji Ueda,
Minoru Kawabata,
Takanori Ninomiya:
Automated Inspection System for Electronic Devices Mounted on Printed Circuit Boards Using Light-Section Method.
MVA 1994: 575-578 |
