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Gerhard Hobler

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1989
2EEGerhard Hobler, Siegfried Selberherr: Monte Carlo simulation of ion implantation into two- and three-dimensional structures. IEEE Trans. on CAD of Integrated Circuits and Systems 8(5): 450-459 (1989)
1988
1EEGerhard Hobler, Siegfried Selberherr: Two-dimensional modeling of ion implantation induced point defects. IEEE Trans. on CAD of Integrated Circuits and Systems 7(2): 174-180 (1988)

Coauthor Index

1Siegfried Selberherr [1] [2]

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