2009 |
28 | EE | Sarmad Abbasi,
Patrick Healy,
Aimal Rextin:
An Improved Upward Planarity Testing Algorithm and Related Applications.
WALCOM 2009: 334-344 |
2008 |
27 | EE | Aimal Rextin,
Patrick Healy:
A Fully Dynamic Algorithm to Test the Upward Planarity of Single-Source Embedded Digraphs.
Graph Drawing 2008: 254-265 |
26 | EE | Mel Gorman,
Patrick Healy:
Supporting superpage allocation without additional hardware support.
ISMM 2008: 41-50 |
25 | EE | Daren Nestor,
Steffen Thiel,
Goetz Botterweck,
Ciarán Cawley,
Patrick Healy:
Applying visualisation techniques in software product lines.
SOFTVIS 2008: 175-184 |
24 | EE | Rick Rabiser,
Patrick Healy,
Daren Nestor,
Mike Mannion,
David Sellier:
2nd International Workshop on Visualisation in Software Product Line Engineering (ViSPLE 2008).
SPLC 2008: 388 |
23 | | Ciarán Cawley,
Steffen Thiel,
Patrick Healy:
Visualising Variability Relationships in Software Product Lines.
SPLC (2) 2008: 329-333 |
22 | EE | Martin Harrigan,
Patrick Healy:
Using a Significant Spanning Tree to Draw a Directed Graph.
J. Graph Algorithms Appl. 12(3): 293-317 (2008) |
2007 |
21 | EE | Martin Harrigan,
Patrick Healy:
Efficiently drawing a significant spanning tree of a directed graph.
APVIS 2007: 53-59 |
20 | EE | Daren Nestor,
Luke O'Malley,
Patrick Healy,
Aaron J. Quigley,
Steffen Thiel:
Visulasation techniques to support derivation tasks in sofware product line development.
CASCON 2007: 315-325 |
19 | EE | Martin Harrigan,
Patrick Healy:
Practical Level Planarity Testing and Layout with Embedding Constraints.
Graph Drawing 2007: 62-68 |
18 | EE | Radoslav Andreev,
Patrick Healy,
Nikola S. Nikolov:
Applying Ant Colony Optimization Metaheuristic to the DAG Layering Problem.
IPDPS 2007: 1-9 |
17 | | Steffen Thiel,
Patrick Healy,
Aaron J. Quigley,
Daren Nestor,
Luke O'Malley:
1st International Workshop on Visualisation in Software Product Line Engineering (ViSPLE 2007).
SPLC (2) 2007: 91-93 |
16 | EE | Patrick Healy,
Karol Lynch:
Building Blocks of Upward Planar Digraphs.
J. Graph Algorithms Appl. 11(1): 3-44 (2007) |
15 | EE | Peter Eades,
Patrick Healy:
Guest Editor's Foreword.
J. Graph Algorithms Appl. 11(2): 323-324 (2007) |
2006 |
14 | | Patrick Healy,
Nikola S. Nikolov:
Graph Drawing, 13th International Symposium, GD 2005, Limerick, Ireland, September 12-14, 2005, Revised Papers
Springer 2006 |
13 | EE | Patrick Healy:
Scheduling Research Grant Proposal Evaluation Meetings and the Range Colouring Problem.
PATAT 2006: 119-131 |
12 | EE | Patrick Healy,
Karol Lynch:
Two Fixed-parameter Tractable Algorithms for Testing Upward Planarity.
Int. J. Found. Comput. Sci. 17(5): 1095-1114 (2006) |
2005 |
11 | EE | Martin Harrigan,
Patrick Healy:
On Layering Directed Acyclic Graphs.
Graph Drawing 2005 |
10 | EE | Patrick Healy,
Karol Lynch:
Fixed-Parameter Tractable Algorithms for Testing Upward Planarity.
SOFSEM 2005: 199-208 |
2004 |
9 | EE | Patrick Healy,
Karol Lynch:
Building Blocks of Upward Planar Digraphs.
Graph Drawing 2004: 296-306 |
8 | EE | Patrick Healy,
Ago Kuusik,
Sebastian Leipert:
A characterization of level planar graphs.
Discrete Mathematics 280(1-3): 51-63 (2004) |
7 | EE | Patrick Healy,
Ago Kuusik:
Algorithms for multi-level graph planarity testing and layout.
Theor. Comput. Sci. 320(2-3): 331-344 (2004) |
2002 |
6 | EE | Patrick Healy,
Nikola S. Nikolov:
A Branch-and-Cut Approach to the Directed Acyclic Graph Layering Problem.
Graph Drawing 2002: 98-109 |
5 | EE | Patrick Healy,
Nikola S. Nikolov:
Facets of the Directed Acyclic Graph Layering Polytope.
WG 2002: 246-257 |
2001 |
4 | EE | Patrick Healy,
Nikola S. Nikolov:
How to Layer a Directed Acyclic Graph.
Graph Drawing 2001: 16-30 |
2000 |
3 | EE | Patrick Healy,
Ago Kuusik,
Sebastian Leipert:
Characterization of Level Non-planar Graphs by Minimal Patterns.
COCOON 2000: 74-84 |
1999 |
2 | EE | Patrick Healy,
Ago Kuusik:
The Vertex-Exchange Graph: A New Concept for Multi-level Crossing Minimisation.
Graph Drawing 1999: 205-216 |
1 | EE | Patrick Healy,
Marcus Creavin,
Ago Kuusik:
An optimal algorithm for rectangle placement.
Oper. Res. Lett. 24(1-2): 73-80 (1999) |