David A. Haynes
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1991
1
Brion L. Keller
, David A. Haynes: Design Automation of Test for the EX/9000
TM
Series Processors.
ICCD 1991
: 550-553
Coauthor
Index
1
Brion L. Keller
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1
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Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
