| |
| 1999 | ||
|---|---|---|
| 3 | EE | Mark C. Hansen, Hakan Yalcin, John P. Hayes: Unveiling the ISCAS-85 Benchmarks: A Case Study in Reverse Engineering. IEEE Design & Test of Computers 16(3): 72-80 (1999) |
| 1995 | ||
| 2 | Mark C. Hansen, John P. Hayes: High-Level Test Generation Using Symbolic Scheduling. ITC 1995: 586-595 | |
| 1 | EE | Mark C. Hansen, John P. Hayes: High-level test generation using physically-induced faults. VTS 1995: 20-28 |
| 1 | John P. Hayes | [1] [2] [3] |
| 2 | Hakan Yalcin | [3] |