| |
| 2005 | ||
|---|---|---|
| 2 | EE | Daniel T. Hamling: Test Solution Selection Using Multiple-Objective Decision Models and Analyses. IEEE Design & Test of Computers 22(2): 126-134 (2005) |
| 1992 | ||
| 1 | Daniel T. Hamling: A 3GHz, 144 Point Probe Fixture for Automatic IC Wafer Testing. ITC 1992: 940-947 | |