| 1994 |
|---|
| 6 | | Inderpal S. Bhandari,
Michael J. Halliday,
Jarir K. Chaar,
Ram Chillarege,
K. Jones,
J. S. Atkinson,
C. Lepori-Costello,
P. Y. Jasper,
E. D. Tarver,
C. C. Lewis,
M. Yonezawa:
In-Process Improvement through Defect Data Interpretation.
IBM Systems Journal 33(1): 182-214 (1994) |
| 5 | EE | Michael J. Halliday,
Inderpal S. Bhandari,
Jarir K. Chaar,
Ram Chillarege:
Experiences in transferring a software process improvement methodology to production laboratories.
Journal of Systems and Software 26(1): 61-68 (1994) |
| 1993 |
|---|
| 4 | | Jarir K. Chaar,
Michael J. Halliday,
Inderpal S. Bhandari,
Ram Chillarege:
On the Evaluation of Software Inspections and Tests.
ITC 1993: 180-189 |
| 3 | EE | Jarir K. Chaar,
Michael J. Halliday,
Inderpal S. Bhandari,
Ram Chillarege:
In-Process Evaluation for Software Inspection and Test.
IEEE Trans. Software Eng. 19(11): 1055-1070 (1993) |
| 2 | EE | Inderpal S. Bhandari,
Michael J. Halliday,
Eric Tarver,
David Brown,
Jarir K. Chaar,
Ram Chillarege:
A Case Study of Software Process Improvement During Development.
IEEE Trans. Software Eng. 19(12): 1157-1170 (1993) |
| 1992 |
|---|
| 1 | EE | Ram Chillarege,
Inderpal S. Bhandari,
Jarir K. Chaar,
Michael J. Halliday,
Diane S. Moebus,
Bonnie K. Ray,
Man-Yuen Wong:
Orthogonal Defect Classification - A Concept for In-Process Measurements.
IEEE Trans. Software Eng. 18(11): 943-956 (1992) |
