| |
| 1992 | ||
|---|---|---|
| 1 | EE | Ram Chillarege, Inderpal S. Bhandari, Jarir K. Chaar, Michael J. Halliday, Diane S. Moebus, Bonnie K. Ray, Man-Yuen Wong: Orthogonal Defect Classification - A Concept for In-Process Measurements. IEEE Trans. Software Eng. 18(11): 943-956 (1992) |
| 1 | Inderpal S. Bhandari | [1] |
| 2 | Jarir K. Chaar | [1] |
| 3 | Ram Chillarege | [1] |
| 4 | Michael J. Halliday | [1] |
| 5 | Bonnie K. Ray | [1] |
| 6 | Man-Yuen Wong | [1] |