1994 | ||
---|---|---|
1 | Inderpal S. Bhandari, Michael J. Halliday, Jarir K. Chaar, Ram Chillarege, K. Jones, J. S. Atkinson, C. Lepori-Costello, P. Y. Jasper, E. D. Tarver, C. C. Lewis, M. Yonezawa: In-Process Improvement through Defect Data Interpretation. IBM Systems Journal 33(1): 182-214 (1994) |
1 | Inderpal S. Bhandari | [1] |
2 | Jarir K. Chaar | [1] |
3 | Ram Chillarege | [1] |
4 | Michael J. Halliday | [1] |
5 | P. Y. Jasper | [1] |
6 | K. Jones | [1] |
7 | C. Lepori-Costello | [1] |
8 | C. C. Lewis | [1] |
9 | E. D. Tarver | [1] |
10 | M. Yonezawa | [1] |