| |
| 2003 | ||
|---|---|---|
| 1 | EE | Andreas Martin, Jochen von Hagen, Glenn B. Alers: Ramped current stress for fast and reliable wafer level reliability monitoring of thin gate oxide reliability. Microelectronics Reliability 43(8): 1215-1220 (2003) |
| 1 | Glenn B. Alers | [1] |
| 2 | Andreas Martin | [1] |