Glenn B. Alers

List of publications from the DBLP Bibliography Server - FAQ

2003

1 EE Andreas Martin, Jochen von Hagen, Glenn B. Alers: Ramped current stress for fast and reliable wafer level reliability monitoring of thin gate oxide reliability. Microelectronics Reliability 43(8): 1215-1220 (2003)

2003
1	EE	Andreas Martin, Jochen von Hagen, Glenn B. Alers: Ramped current stress for fast and reliable wafer level reliability monitoring of thin gate oxide reliability. Microelectronics Reliability 43(8): 1215-1220 (2003)

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