2008 |
31 | EE | Dennis Jeffrey,
Neelam Gupta,
Rajiv Gupta:
Identifying the root causes of memory bugs using corrupted memory location suppression.
ICSM 2008: 356-365 |
30 | EE | Rajiv Gupta,
Neelam Gupta,
Xiangyu Zhang,
Dennis Jeffrey,
Vijay Nagarajan,
Sriraman Tallam,
Chen Tian:
Scalable dynamic information flow tracking and its applications.
IPDPS 2008: 1-5 |
29 | EE | Dennis Jeffrey,
Neelam Gupta,
Rajiv Gupta:
Fault localization using value replacement.
ISSTA 2008: 167-178 |
28 | EE | Dennis Jeffrey,
Neelam Gupta:
Experiments with test case prioritization using relevant slices.
Journal of Systems and Software 81(2): 196-221 (2008) |
2007 |
27 | EE | Vijayanand Nagarajan,
Dennis Jeffrey,
Rajiv Gupta,
Neelam Gupta:
ONTRAC: A system for efficient ONline TRACing for debugging.
ICSM 2007: 445-454 |
26 | EE | Neelam Gupta,
Rajiv Gupta:
ExPert: Dynamic Analysis Based Fault Location via Execution Perturbations.
IPDPS 2007: 1-6 |
25 | EE | Xiangyu Zhang,
Sriraman Tallam,
Neelam Gupta,
Rajiv Gupta:
Towards locating execution omission errors.
PLDI 2007: 415-424 |
24 | EE | Xiangyu Zhang,
Neelam Gupta,
Rajiv Gupta:
A study of effectiveness of dynamic slicing in locating real faults.
Empirical Software Engineering 12(2): 143-160 (2007) |
23 | EE | Dennis Jeffrey,
Neelam Gupta:
Improving Fault Detection Capability by Selectively Retaining Test Cases during Test Suite Reduction.
IEEE Trans. Software Eng. 33(2): 108-123 (2007) |
22 | EE | Xiangyu Zhang,
Neelam Gupta,
Rajiv Gupta:
Locating faulty code by multiple points slicing.
Softw., Pract. Exper. 37(9): 935-961 (2007) |
2006 |
21 | | Johannes Mayer,
Neelam Gupta,
Yves Ledru:
Third International Workshop on Software Quality Assurance, SOQUA 2006, Portland, Oregon, USA, November 6, 2006
ACM 2006 |
20 | EE | Dennis Jeffrey,
Neelam Gupta:
Test Case Prioritization Using Relevant Slices.
COMPSAC (1) 2006: 411-420 |
19 | EE | Neelam Gupta,
Andy Podgurski:
Fourth international workshop on dynamic analysis (WODA 2006).
ICSE 2006: 1035 |
18 | EE | Xiangyu Zhang,
Neelam Gupta,
Rajiv Gupta:
Locating faults through automated predicate switching.
ICSE 2006: 272-281 |
17 | EE | Xiangyu Zhang,
Neelam Gupta,
Rajiv Gupta:
Pruning dynamic slices with confidence.
PLDI 2006: 169-180 |
2005 |
16 | EE | Xiangyu Zhang,
Haifeng He,
Neelam Gupta,
Rajiv Gupta:
Experimental evaluation of using dynamic slices for fault location.
AADEBUG 2005: 33-42 |
15 | EE | Neelam Gupta,
Dale Smith:
A Field-Portable Simultaneous Dual-band Infrared Hyperspectral Imager.
AIPR 2005: 87-93 |
14 | EE | Neelam Gupta,
Haifeng He,
Xiangyu Zhang,
Rajiv Gupta:
Locating faulty code using failure-inducing chops.
ASE 2005: 263-272 |
13 | EE | Dennis Jeffrey,
Neelam Gupta:
Test Suite Reduction with Selective Redundancy.
ICSM 2005: 549-558 |
12 | EE | Sriraman Tallam,
Neelam Gupta:
A concept analysis inspired greedy algorithm for test suite minimization.
PASTE 2005: 35-42 |
2004 |
11 | EE | Haifeng He,
Neelam Gupta:
Automated Debugging Using Path-Based Weakest Preconditions.
FASE 2004: 267-280 |
10 | EE | Neelam Gupta,
YongJun Cho,
Mohammad Z. Hossain:
Experiments with UNA for solving linear constraints in real variables.
SAC 2004: 1013-1020 |
2003 |
9 | EE | Neelam Gupta:
Fused Spectropolarimetric Visible Near-IR Imaging.
AIPR 2003: 21-26 |
8 | EE | Michele Hinnrichs,
Neelam Gupta,
Arnold Goldberg:
Dual Band (MWIR/LWIR) Hyperspectral Imager.
AIPR 2003: 73-80 |
7 | EE | Neelam Gupta,
Zachary V. Heidepriem:
A New Structural Coverage Criterion for Dynamic Detection of Program Invariants.
ASE 2003: 49-59 |
2002 |
6 | EE | Srinivas Visvanathan,
Neelam Gupta:
Generating Test Data for Functions with Pointer Inputs.
ASE 2002: 149- |
5 | | Rajiv Gupta,
Neelam Gupta:
Data Flow Testing.
The Compiler Design Handbook 2002: 247-268 |
2001 |
4 | EE | Neelam Gupta,
Praveen Rao:
Program Execution-Based Module Cohesion Measurement.
ASE 2001: 144- |
2000 |
3 | EE | Neelam Gupta,
Aditya P. Mathur,
Mary Lou Soffa:
Generating Test Data for Branch Coverage.
ASE 2000: 219-228 |
1999 |
2 | EE | Neelam Gupta,
Aditya P. Mathur,
Mary Lou Soffa:
UNA Based Iterative Test Data Generation and Its Evaluation.
ASE 1999: 224- |
1998 |
1 | EE | Neelam Gupta,
Aditya P. Mathur,
Mary Lou Soffa:
Automated Test Data Generation Using an Iterative Relaxation Method.
SIGSOFT FSE 1998: 231-244 |