| |
| 1996 | ||
|---|---|---|
| 2 | EE | Roberto Bevacqua, Luca Guerrazzi, Franco Fummi: SCAN/BIST Techniques for Decreasing Test Storage and their implications to Test Pattern Generation. EUROMICRO 1996: 351- |
| 1 | EE | Roberto Bevacqua, Luca Guerrazzi, Fabrizio Ferrandi, Franco Fummi: Implicit Test Sequences Compaction for Decreasing Test Application Cos. ICCD 1996: 384-382 |
| 1 | Roberto Bevacqua | [1] [2] |
| 2 | Fabrizio Ferrandi | [1] |
| 3 | Franco Fummi | [1] [2] |