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Kristian Granhaug

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2008
4EEKristian Granhaug, Snorre Aunet: Improving Yield and Defect Tolerance in Subthreshold CMOS Through Output-Wired Redundancy. J. Electronic Testing 24(1-3): 157-163 (2008)
2006
3 Kristian Granhaug, Snorre Aunet: Six Subthreshold Full Adder Cells Characterized in 90 nm CMOS Technology. DDECS 2006: 27-32
2EEKristian Granhaug, Snorre Aunet: Improving Yield and Defect Tolerance in Multifunction Subthreshold CMOS Gates. DFT 2006: 20-28
1EEKristian Granhaug, Snorre Aunet, Tor Sverre Lande: Body-bias regulator for ultra low power multifunction CMOS gates. ISCAS 2006

Coauthor Index

1Snorre Aunet [1] [2] [3] [4]
2Tor Sverre Lande [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)