2000 | ||
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2 | K. Mori, N. Yoshikawa, K. Morita, T. Kimura, H. Goto, M. Asamori, Y. Kamio, Y. Fukuda: Neo-kaizen Applications on the Generic Operations Support and Renewal. DIISM 2000: 236-243 | |
1997 | ||
1 | EE | H. Goto, S. Nakamura, K. Iwasaki: Experimental fault analysis of 1 Mb SRAM chips. VTS 1997: 31-36 |
1 | M. Asamori | [2] |
2 | Y. Fukuda | [2] |
3 | K. Iwasaki | [1] |
4 | Y. Kamio | [2] |
5 | T. Kimura | [2] |
6 | K. Mori | [2] |
7 | K. Morita | [2] |
8 | S. Nakamura | [1] |
9 | N. Yoshikawa | [2] |