2008 |
6 | EE | Piotr Jantos,
Damian Grzechca,
Tomasz Golonek,
Jerzy Rutkowski:
The Influence of Global Parametric Faults on Analogue Electronic Circuits Time Domain Response Features.
DDECS 2008: 299-303 |
5 | EE | Piotr Jantos,
Damian Grzechca,
Tomasz Golonek,
Jerzy Rutkowski:
Gene Expression Programming-Based Method of Optimal Frequency Set Determination for Purpose of Analogue Circuits' Diagnosis.
Computer Recognition Systems 2 2008: 794-801 |
2007 |
4 | | Tomasz Golonek,
Damian Grzechca,
Jerzy Rutkowski:
Evolutionary System for Analog Test Frequencies Selection with Fuzzy Initialization.
DDECS 2007: 353-356 |
3 | EE | Damian Grzechca,
Tomasz Golonek,
Jerzy Rutkowski:
Simulated Annealing with Fuzzy Fitness Function for Test Frequencies Selection.
FUZZ-IEEE 2007: 1-6 |
2006 |
2 | EE | Damian Grzechca,
Tomasz Golonek,
Jerzy Rutkowski:
Analog fault AC dictionary creation - the fuzzy set approach.
ISCAS 2006 |
1 | EE | Tomasz Golonek,
Damian Grzechca,
Jerzy Rutkowski:
Application of genetic programming to edge detector design.
ISCAS 2006 |