P. G. Goetz

2002
1	EE	K. Ikossi, W. S. Rabinovich, D. S. Katzer, S. C. Binari, J. Mittereder, P. G. Goetz: Multiple quantum well PIN optoelectronic devices and a method of restoring failed device characteristics. Microelectronics Reliability 42(7): 1021-1028 (2002)

Coauthor Index

1	S. C. Binari	[1]
2	K. Ikossi	[1]
3	D. S. Katzer	[1]
4	J. Mittereder	[1]
5	W. S. Rabinovich	[1]