2002 | ||
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1 | EE | K. Ikossi, W. S. Rabinovich, D. S. Katzer, S. C. Binari, J. Mittereder, P. G. Goetz: Multiple quantum well PIN optoelectronic devices and a method of restoring failed device characteristics. Microelectronics Reliability 42(7): 1021-1028 (2002) |
1 | P. G. Goetz | [1] |
2 | K. Ikossi | [1] |
3 | D. S. Katzer | [1] |
4 | J. Mittereder | [1] |
5 | W. S. Rabinovich | [1] |