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2009 | ||
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2 | EE | Pradeep Gnanaprakasam, Johné M. Parker, Subburengan Ganapathiraman, Zhen Hou: Efficient 3D characterization of raised topological defects in smooth specular coatings. Image Vision Comput. 27(4): 319-330 (2009) |
2002 | ||
1 | Johné M. Parker, Yew Lim Cheong, Pradeep Gnanaprakasam, Zhen Hou, Joseph Istre: Inspection Technology to Facilitate Automated Quality Control of Highly Specular, Smooth Coated Surfaces. ICRA 2002: 2567-2574 |
1 | Yew Lim Cheong | [1] |
2 | Subburengan Ganapathiraman | [2] |
3 | Zhen Hou | [1] [2] |
4 | Joseph Istre | [1] |
5 | Johné M. Parker | [1] [2] |