| |
| 2009 | ||
|---|---|---|
| 1 | EE | Pradeep Gnanaprakasam, Johné M. Parker, Subburengan Ganapathiraman, Zhen Hou: Efficient 3D characterization of raised topological defects in smooth specular coatings. Image Vision Comput. 27(4): 319-330 (2009) |
| 1 | Pradeep Gnanaprakasam | [1] |
| 2 | Zhen Hou | [1] |
| 3 | Johné M. Parker | [1] |