| |
| 2003 | ||
|---|---|---|
| 1 | EE | P. Charpenel, F. Davenel, R. Digout, M. Giraudeau, M. Glade, J. P. Guerveno, N. Guillet, A. Lauriac, S. Male, D. Manteigas: The right way to assess electronic system reliability: FIDES. Microelectronics Reliability 43(9-11): 1401-1404 (2003) |
| 1 | P. Charpenel | [1] |
| 2 | F. Davenel | [1] |
| 3 | R. Digout | [1] |
| 4 | M. Giraudeau | [1] |
| 5 | J. P. Guerveno | [1] |
| 6 | N. Guillet | [1] |
| 7 | A. Lauriac | [1] |
| 8 | S. Male | [1] |
| 9 | D. Manteigas | [1] |