![]() | ![]() |
2003 | ||
---|---|---|
1 | EE | P. Charpenel, F. Davenel, R. Digout, M. Giraudeau, M. Glade, J. P. Guerveno, N. Guillet, A. Lauriac, S. Male, D. Manteigas: The right way to assess electronic system reliability: FIDES. Microelectronics Reliability 43(9-11): 1401-1404 (2003) |
1 | P. Charpenel | [1] |
2 | F. Davenel | [1] |
3 | M. Giraudeau | [1] |
4 | M. Glade | [1] |
5 | J. P. Guerveno | [1] |
6 | N. Guillet | [1] |
7 | A. Lauriac | [1] |
8 | S. Male | [1] |
9 | D. Manteigas | [1] |