Rani S. Ghaida

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2009

2 EE Rani S. Ghaida, Payman Zarkesh-Ha: A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects. J. Electronic Testing 25(1): 67-77 (2009)

2007

1 EE Rani S. Ghaida, Payman Zarkesh-Ha: Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model. DFT 2007: 59-67

2009
2	EE	Rani S. Ghaida, Payman Zarkesh-Ha: A Layout Sensitivity Model for Estimating Electromigration-vulnerable Narrow Interconnects. J. Electronic Testing 25(1): 67-77 (2009)
2007
1	EE	Rani S. Ghaida, Payman Zarkesh-Ha: Estimation of Electromigration-Aggravating Narrow Interconnects Using a Layout Sensitivity Model. DFT 2007: 59-67

Coauthor Index

1 Payman Zarkesh-Ha [1] [2]