| |
| 2006 | ||
|---|---|---|
| 3 | EE | Reza Ghaffarian: CCGA packages for space applications. Microelectronics Reliability 46(12): 2006-2024 (2006) |
| 2 | EE | S. Manian Ramkumar, Reza Ghaffarian, Arun Varanasi: Lead-free 0201 manufacturing, assembly and reliability test results. Microelectronics Reliability 46(2-4): 244-262 (2006) |
| 2003 | ||
| 1 | EE | Reza Ghaffarian: Qualification approaches and thermal cycle test results for CSP/BGA/FCBGA. Microelectronics Reliability 43(5): 695-706 (2003) |
| 1 | S. Manian Ramkumar | [2] |
| 2 | Arun Varanasi | [2] |