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| 2005 | ||
|---|---|---|
| 2 | EE | A. Madan, S. C. Bose, P. J. George, Chandra Shekhar: Evaluation of Device Parameters of HfO2/SiO2/Si Gate Dielectric Stack for MOSFETs. VLSI Design 2005: 386-391 |
| 2001 | ||
| 1 | EE | B. Prasad, P. J. George, Chandra Shekhar: High Frequency Behaviour Of Electron Transport In Silicon And Its Implication For Drain Conductance Of Mos Transistors. VLSI Design 2001: 491-494 |
| 1 | S. C. Bose | [2] |
| 2 | A. Madan | [2] |
| 3 | B. Prasad | [1] |
| 4 | Chandra Shekhar | [1] [2] |