A. Madan
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2005
1
EE
A. Madan,
S. C. Bose
,
P. J. George
,
Chandra Shekhar
: Evaluation of Device Parameters of HfO2/SiO2/Si Gate Dielectric Stack for MOSFETs.
VLSI Design 2005
: 386-391
Coauthor
Index
1
S. C. Bose
[
1
]
2
P. J. George
[
1
]
3
Chandra Shekhar
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
